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Atomic force microscope
Supervisors: Felice Carlo Simeone, Federico Veronesi
The atomic force microscope AFM A100 can image surface topography with nanometric resolution and provide information about mechanical, electrical and magnetic properties (e.g.) related to the surface of materials such as nanodots, nanotubes, and nanofibers.
AFM A100 scans surfaces with a tip of micrometric curvature radius placed at the edge of a cantilever. The tip interacts with the surface, bending the cantilever. As surface topography or other properties vary, a variation in the tip-surface interaction is recorded, allowing to reconstruct surface topography.
AFM A100 can be used for measurements in air or in a liquid medium. It is also equipped with an anti-vibration system that eliminates disturbances like noise or vibrations, thus enhancing signal quality.
A100 A.P.E. Research Atomic Force Microscope
Atomic Force Microscope able to work in contact, non-contact and tapping modes. It can scan up to 25 x 25 square micrometers with a level of vertical noise of about 0.1 nanometers, which makes it possible to analyze surface features (e.g., monoatomic steps) with nanometric resolution.
